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专利名称：Automatic test program generation using
extended conditional constraint satisfaction
发明人：Allon Adir,Eyal Bin,Roy Emek,Kirill Shoikhet申请号：US11040241申请日：20050121
公开号：US20060184468A1公开日：20060817
专利附图：
摘要：A method for automatically generating test programs includes receiving adescription of a system under test, expressed in terms of variables associated with thesystem and conditional constraints including semantics applied to the variables, and
receiving a definition of an event to be tested in the system. The method generates anECondCSP over the variables responsively to the definition of the event and to theconditional constraints, such that at least some of the semantics of the conditionalconstraints are preserved in the ECondCSP when one or more of the variables to whichthe semantics are applied are inactive. The ECondCSP is solved to generate a test case forthe system.
申请人：Allon Adir,Eyal Bin,Roy Emek,Kirill Shoikhet
地址：Kiryat Tivon IL,Haifa IL,Tel Aviv-Jaffa IL,Haifa IL
国籍：IL,IL,IL,IL
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